TY  - BOOK
AU  - Crouch,Alfred L.
TI  - Design-for-test for digital IC's and embedded core systems
SN  - 0130848271
AV  - TK7874.65 .C76 1999
U1  - 621.3815 21
PY  - 2008///
CY  - New Delhi
PB  - Pearson Educaion
KW  - Engineering
KW  - Digital integrated circuits
KW  - Design and construction
KW  - Electronic circuit design
KW  - Automatic test equipment
KW  - Embedded computer systems
N1  - Includes bibliographical references and index
ER  -