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Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.

By: Material type: TextTextPublication details: New Delhi : Pearson Educaion, 2008..Description: xxvii, 349 p. : ill. ; 25 cmISBN:
  • 0130848271
Subject(s): DDC classification:
  • 621.3815 21 CRD
LOC classification:
  • TK7874.65 .C76 1999
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Holdings
Item type Current library Call number Status Date due Barcode
Books Books Hall D 621.3815 CRD (Browse shelf(Opens below)) Available 93188

Includes bibliographical references and index.

System requirements for accompanying computer disc: UNIX ; Microsoft Windows.

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